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HBM良率,如何提高?
为了在竞争激烈的HBM市场达到可接受的良率,芯片制造商正在优化3D检测方法,以照亮关键的凸块缺陷,如空洞、焊盘未对准和焊料挤出。使用激光三角测量法的自动光学检测可以提供凸块高度和共面性测量,而X射线检测工具非常适合测量隐藏的凸块特性。同样,声学检测工 ...
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