Designed for use with Agilent Technologies logic analyzers, the FS4410 Serial RapidIO (SRIO) protocol analysis probe allows non-intrusive, real-time monitoring of SRIO buses with 8-and 10-bit data ...

The logic probe is powered from the device under test (DUT)—it may be any binary logic, which can be powered in the range +2 V to +6 V. This may be a microcontroller or 74/54 series logic chips, ...

To achieve this, multiple factors that include the IC design, the ATE test cell, and the probe card solution must be considered. Ultimately, test-cost reduction boils down to two efforts: optimizing ...

Test probes go a long way toward ensuring accurate, repeatable test results. Here's a look at how both active and passive test probes are evolving to match today's broadening oscilloscope bandwidths.

A probe card is an edge between an electronic test system and semiconductor wafer. It is used to check quality of integrated circuit (IC) or large-scale integration (LSI) chips in the semiconductor ...

[youtube=https://www.youtube.com/watch?v=XZz1W-LurlU&w=580] We had [Mark] on our “dance card” for people to find at Maker Faire. But before we could track him ...

[Robert Morrison] had an ancient HP 545A logic probe, which was great for debugging SMT projects. The only problem was that being 45 years old, it wasn’t quite up to scratch when it came to debugging ...