Abstract: DC hot switching lifetime for Au-Au-contact MEMS switch is studied in this work, in which the applied voltage varies from 5 to 8 V. Weibull distribution analysis is employed for lifetime ...

Abstract: In this study, impact of traps located at SiO 2 /Si interface on the time-dependent dielectric breakdown (TDDB) lifetime is investigated by modeling the Weibull distribution in high-k (HK) ...

ABSTRACT: In previous research works on one hand, terrain, meteorological and wind speed data from various Burundian sites have been processed in order to bring efficient tools for the planning and ...