Abstract: This paper explores the trade-offs of reducing scan test patterns during Wafer Sort, accepting additional packaging costs, and screening more chips during Package Tests. Previous works ...

Abstract: Deep neural networks (DNNs) have emerged as an effective approach in many artificial intelligence tasks. Several specialized accelerators are often used to enhance DNN's performance and ...

Four NTT INDYCAR SERIES drivers tested Oct. 21 at Indianapolis Motor Speedway, each working through separate programs. Reigning series champion Alex Palou of Chip Ganassi Racing and Pato O’Ward from ...