Researchers at Purdue University have created a "unified model" for predicting the reliability of new designs for silicon transistors – a potential tool that industry could use to save tens of ...

WEST LAFAYETTE, Ind. - Researchers at Purdue University have created a "unified model" for predicting the reliability of new designs for silicon transistors - a potential tool that industry could use ...

The circuit has been constructed to provide an in-circuit system that will test the integrity of electronic components such as Silicon Controlled Rectifiers, diodes, and PNP or NPN transistors. 4093 – ...

(Nanowerk News) Graphene, a one-atom-thick layer of graphitic carbon, has the potential to make consumer electronic devices faster and smaller. But its unique properties, and the shrinking scale of ...

This file type includes high resolution graphics and schematics. The spread of h FE values in a batch of transistors may be wide enough to cause unreliable performance during mass production of a ...

We have all had difficulty testing diodes in-circuit. Most DMM’s have a diode Vf function that measures forward drop, but what is the normal voltage drop? Analog VOM’s attempt to measure resistance of ...

Last time on Circuit VR, we looked at creating a very simple common emitter amplifier, but we didn’t talk about how to select the capacitor values, or much about why we wanted them. We are going to ...

The following automatic battery-charger design is created with a circuit that could qualify as the simplest window comparator ever built around a single transistor (see the figure). It starts charging ...