A non-parametric test for the bivariate c-sample problem is proposed. The test is an extension of a bivariate two-sample test given by Mardia (1967) and possesses various desirable properties. We ...

Scandinavian Journal of Statistics, Vol. 45, No. 2 (June 2018), pp. 217-254 (38 pages) Non-parametric generalized likelihood ratio test is a popular method of model checking for regressions. However, ...

Linear models, generalized linear models, and nonlinear models are examples of parametric regression models because we know the function that describes the relationship between the response and ...

We have performed a genome scan using 25 nuclear families consisting of right-handed parents with at least two left-handed children. Handedness was assessed as a qualitative trait using a laterality ...

This short course will provide an overview of non-parametric statistical techniques. The course will first describe what non-parametric statistics are, when they should be used, and their advantages ...

The foundation of parametric test within semiconductor manufacturing is its usefulness in determining that wafers have been fabricated properly. Foundries use parametric test results to help verify ...

SANTA ROSA, Calif.--(BUSINESS WIRE)-- Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to ...

SANTA ROSA, Calif.--(BUSINESS WIRE)--Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to ...

No part of a product life cycle is immune to time-to-market pressures, and that includes wafer-level parametric tests on scribe-line test structures. Parallel parametric test is emerging as a ...

September 25, 2014. Keithley Instruments Inc. today announced it had received orders for additional S530 parametric test systems from X-FAB Silicon Foundries. X-FAB, a Germany-based foundry for analog ...

Keithley Instruments introduced today the latest upgrades to its popular S530 Parametric Test Systems, the semiconductor industry’s most cost-effective solution for high-speed production parametric ...