The standard approach for testing IC logic is the use of scan chains, with embedded compression as the standard approach for applying scan patterns. Embedded compression enables the same test quality ...
Embedded test compression is a standard technique for dramatically reducing the test data volume and test time on the automatic test equipment. Companies typically aim for 60x to 100x compression for ...
IC designers now have a powerful weapon in the struggle against rising test costs: commercially available EDA solutions that provide fast and effective means to implement scan compression on-chip. By ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results