Test compression sounds like magic. Read on to learn how this trick is done. Large, complex ICs are viable because their design meets test as well as functional requirements. Design for test (DFT) was ...

Embedded test compression is a standard technique for dramatically reducing the test data volume and test time on the automatic test equipment. Companies typically aim for 60x to 100x compression for ...

Until the mid-1970s, compression testing of composite materials received relatively little attention. Up to that point it, had generally been assumed that the compressive stiffness was approximately ...

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...

For the past five years, the cost of test has prevailed as the hottest topic in test. During this period, automated test equipment (ATE) has made a dramatic move towards low-cost design for test (DFT) ...

Design automation is the key to the development of very large ICs. Optimizing the connection and layout of millions of gates to efficiently perform complex functions is not a job to which humans are ...

I noted in a 2005 column (see "Current compression test methods" under “Editor's Pick,” at top right) that there are three basic methods of loading a composite material test specimen in compression: ...